This laboratory handles investigation of surfaces and materials including element analysis using electron microscopy. Machining and surface modification is achieved by focused ion beam. Electron microscope Tescan LYRA and AFM and SNOM (NT-MDT) scanning microscopes are used to achieve these goals.
Laboratory equipment
Scanning electron microscope with focused beam
Microscope Tescan LYRA XMU.
Convenient examination and sample placement thanks to the fully motorized five-axis manipulator. The system accommodates the following requirements and new trends: an alternative to addition of a larger manipulator for larger samples, optimization of port geometry for microanalytical purposes, has the required geometry for input ports for EDX, WDX and EBSD.
Scanning electron microscope LYRA XMU Tescan
Responsible person
