The functional sample is represented by graphite probes for scanning tunneling microscopy and lithography, which a sharp conductive tip prepared by one of selected methods, in particular by: mechanical milling, electrochemical etching, ion and laser beam etching. They could be implemented into existing holders for STM probes holders. The probe is made from graphite used commonly for manufacturing micropencil lead. The cultivate radius is determined by both choice of flexible parameters of preparation procedure and choice of lead with suitable hardness.
STM probe from graphite material and methods of its preparation
Result type
funkční vzorek
Description