Noise Diagnostics Group

Main research areas

The group specializes in non-destructive diagnostics of electronic components, sensors, electrical insulation and building materials. Their work uses advanced techniques for monitoring transport and fluctuation processes, as well as acoustic and electromagnetic emission methods. These methods allow detailed analysis and evaluation of materials and components without damaging them, which is key to ensuring quality and reliability in a variety of industrial applications.

We have long-standing collaborations with leading scientific institutions and industrial partners, enabling us to continuously improve our methods and approaches and apply them in the real world. Our major partners include Kyocera AVX and Onsemi, with whom we have a long-standing collaboration focused on the diagnosis and analysis of electronic components. This collaboration brings mutual benefits, enables the exchange of knowledge and technology, and promotes innovation in non-destructive testing.

Main practical research results

Main research publications

Other products and projects see link - https://www.vut.cz/vav/projekty

Hlavní průmyslový partneři 

IMI logo                                 - World leader in motion control technology.  - https://www.hybemesvetem.cz

Onsemi logo                - ON Semiconductor Corporation is an American semiconductor supply company - https://www.onsemi.com

ESA logo       Europe's main centre for space research - https://www.esa.int

Airbus logoa major supplier of the European Future Combat Air System (FCAS) - https://www.airbus.com/en/defence

Main R&D partners

Augsburg University logo                                              Institut für Physik Universität Augsburg - https://www.uni-augsburg.de/de/fakultaet/mntf/physik

San Sebastian logo                    - LABORATORY ON DIELECTRIC SPECTROSCOPY - Physics

Department of Material Engineering logo                                             Department of Material Engineering, University of Tokyo - https://rme.mm.t.u-tokyo.ac.jp/index_e.html